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半导体制造过程中的个人氟化物和溶剂暴露及其决定因素。

Personal fluoride and solvent exposures, and their determinants, in semiconductor manufacturing.

作者信息

Woskie S R, Hammond S K, Hines C J, Hallock M F, Kenyon E, Schenker M B

机构信息

Department of Work Environment, University of Massachusetts Lowell, USA.

出版信息

Appl Occup Environ Hyg. 2000 Apr;15(4):354-61. doi: 10.1080/104732200301476.

Abstract

Personal air sampling for fluorides and solvents was done at 35 semiconductor fabrication facilities in the United States. Fluoride compounds were used in etching and cleaning operations, and solvents were used in photoresist and developing operations. All personal solvent and fluoride levels were less than 2 percent of current Occupational Safety and Health Administration (OSHA) standards. Statistical models of the exposure determinants for the target agents found production level, as indicated by number of semiconductor wafer cassettes loaded/unloaded from the target machines or baths, was predictive of fluoride, xylene and 1-methoxy-2-propyl acetate exposures. The percent of fresh air ventilation and the percent of xylene in the photoresist were also significant determinants in the statistical model predicting personal xylene exposure levels.

摘要

在美国的35家半导体制造工厂进行了针对氟化物和溶剂的个人空气采样。氟化物化合物用于蚀刻和清洁操作,溶剂用于光刻胶和显影操作。所有个人溶剂和氟化物水平均低于当前职业安全与健康管理局(OSHA)标准的2%。目标物质暴露决定因素的统计模型发现,如从目标机器或槽中装卸的半导体晶圆盒数量所示的生产水平,可预测氟化物、二甲苯和1-甲氧基-2-乙酸丙酯的暴露情况。在预测个人二甲苯暴露水平的统计模型中,新鲜空气通风百分比和光刻胶中二甲苯百分比也是重要的决定因素。

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