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原子力显微镜:一种研究离子载体的工具。

Atomic force microscope: a tool for studying ionophores.

作者信息

Zammaretti P, Fakler A, Zaugg F, Spichiger-Keller UE

机构信息

Centre for Chemical Sensors/Biosensors and bioAnalytical Chemistry, Department of Pharmacy, Swiss Federal Institute of Technology, Zurich.

出版信息

Anal Chem. 2000 Aug 15;72(16):3689-95. doi: 10.1021/ac000084u.

Abstract

The aim of the investigations was to show the analytical use of an atomic force microscopy (AFM) tip coated with an ion-selective membrane and to show that the ion-selective boundary potential is detectable as a force induced by ion-selective electrostatic interactions, which are more pronounced than double-layer forces. This new technique allows the area-specific ion exchange over boundaries to be displayed with a destruction-free technique by AFM in an aqueous buffer. From experiments with ISEs (ion-selective electrodes), a boundary potential for valinomycin was assumed to be established in close vicinity to a K+-releasing surface. To trace this boundary potential, an AFM tip was coated with a potassium-selective polymer film containing valinomycin as used in preparing ISEs. The K+-releasing substrate was prepared by incorporating a lipophilic potassium salt into a plasticized PVC layer. In contact with an electrolyte such as sodium chloride solution, an ion exchange takes place. Analogue experiments were performed using a sodium-selective ionophore, DD16C5, incorporated into the coating of the AFM tip, with a Na+-releasing substrate. The boundary potential was traced and investigated with the help of force vs distance curves. The resulting adhesion forces for a valinomycin-coated tip in a 150 mM NaCl solution were 9.8+/-3.275 nN using a blank PVC substrate and 330.15+/-113.0 nN using a substrate containing 10 wt % potassium tetrakis(4-chlorophenyl) borate. The selectivity of the ion-selective AFM tips was measured on sodium relative to potassium-releasing substrates and studied in different salt solutions with concentrations between 10 mmol L(-1) and 1 mol L(-1). For valinomycin, a force selectivity coefficient log Kf(K,Na) of -2.5+/-0.5 for K+ against Na+ and a selectivity coefficient log Kf(Na,K) of -4 +/- -0.5 for DD16C5 were measured. In addition, the surface of the polymer substrate was imaged by AFM in contact mode with and without lipophilic potassium salt. The modulation of the force-distance curves induced by the ion exchange was compared to the experimental change in elasticity of the blank and ion-exchanging substrate. The Young's moduli measured with strain force analysis on a potassium-containing substrate were 5 times smaller than the ones registered with nanoindentation and did not explain the modulation of the force vs distance curves.

摘要

这些研究的目的是展示涂覆有离子选择性膜的原子力显微镜(AFM)探针的分析用途,并表明离子选择性边界电位可作为由离子选择性静电相互作用诱导的力被检测到,这种相互作用比双层力更为显著。这项新技术使得通过AFM在水性缓冲液中以无损技术展示边界上特定区域的离子交换成为可能。从离子选择性电极(ISE)的实验中,假定在靠近钾释放表面的位置建立了缬氨霉素的边界电位。为了追踪这个边界电位,AFM探针涂覆了一种含缬氨霉素的钾选择性聚合物膜,这与制备ISE时所用的膜相同。钾释放底物是通过将亲脂性钾盐掺入增塑的PVC层中制备的。与诸如氯化钠溶液等电解质接触时,会发生离子交换。使用掺入AFM探针涂层中的钠选择性离子载体DD16C5以及钠释放底物进行了类似实验。借助力与距离曲线追踪并研究了边界电位。在150 mM NaCl溶液中,使用空白PVC底物时,涂覆有缬氨霉素的探针产生的粘附力为9.8±3.275 nN,而使用含有10 wt%四(4 - 氯苯基)硼酸钾的底物时为330.15±113.0 nN。在相对于钾释放底物的钠上测量了离子选择性AFM探针的选择性,并在浓度介于10 mmol L⁻¹和1 mol L⁻¹之间的不同盐溶液中进行了研究。对于缬氨霉素,测量得到钾对钠的力选择性系数log Kf(K,Na)为 -2.5±0.5,对于DD16C5,钠对钾的选择性系数log Kf(Na,K)为 -4 ± -0.5。此外,在有和亲脂性钾盐的情况下,通过接触模式用AFM对聚合物底物表面进行了成像。将离子交换引起的力 - 距离曲线的调制与空白和离子交换底物的弹性实验变化进行了比较。在含钾底物上通过应变力分析测量的杨氏模量比用纳米压痕测量的杨氏模量小5倍,并且无法解释力与距离曲线的调制情况。

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