van Aken R H, Hagen C W, Barth J E, Kruit P
Charged Particle Optics Group, Department of Applied Physics, Delft University of Technology, Lorentzweg 1, 2628CJ Delft, The Netherlands.
Ultramicroscopy. 2002 Dec;93(3-4):321-30. doi: 10.1016/s0304-3991(02)00287-5.
A spherical and chromatic aberration corrector for electron microscopes is proposed, consisting of a thin foil sandwiched between two apertures. The electrons are retarded at the foil to almost zero energy, so that they can travel ballistically through the foil. It is shown that such a low-voltage corrector has a negative spherical aberration for not too large distances between aperture and foil, as well as a negative chromatic aberration. For various distances the third- and fifth-order spherical aberration coefficients and the first- and second-order chromatic aberration coefficients are calculated using ray tracing. Provided that the foils have sufficient electron transmission the corrector is able to correct the third-order spherical aberration and the first-order chromatic aberration of a typical low-voltage scanning electron microscope. Preliminary results show that the fifth-order spherical aberration and the second-order chromatic aberration can be kept sufficiently low.
本文提出了一种用于电子显微镜的球差和色差校正器,它由夹在两个孔径之间的薄箔组成。电子在薄箔处被减速至几乎零能量,从而能够以弹道方式穿过薄箔。结果表明,对于孔径与薄箔之间不太大的距离,这种低电压校正器具有负球差以及负色差。使用光线追迹法计算了不同距离下的三阶和五阶球差系数以及一阶和二阶色差系数。只要薄箔具有足够的电子透射率,该校正器就能校正典型低电压扫描电子显微镜的三阶球差和一阶色差。初步结果表明,五阶球差和二阶色差可以保持在足够低的水平。