Uo Motohiro, Berglund Anders, Cardenas Juan, Pohl Lars, Watari Fumio, Bergman Maud, Sjöberg Staffan
Department of Dental Materials and Engineering, Graduate School of Dental Medicine, Hokkaido University, 060-8586 Sapporo, Japan.
Dent Mater. 2003 Nov;19(7):639-44. doi: 10.1016/s0109-5641(03)00007-1.
It is important to characterize the surface of dental amalgam in order to understand the process of mercury release from amalgam restorations in the oral cavity. The mercury evaporation occurs not only from the newly made restoration but also from the set material.
The surfaces of four different types of amalgams, which had been well set, were analyzed with X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) and the relationship between surface compositions and mercury release was studied. Fresh amalgam surfaces as well as aged surfaces, which were stored for 30 days in air, were investigated using XPS and the chemical states of amalgam components and oxygen were studied. The aged surfaces were also characterized with XRD and grazing angle XRD.
With increased oxidation, the surface contents of tin and oxygen were increased in all amalgams. In contrast, the surface contents of copper and mercury were decreased. An increase of zinc or indium content were observed in zinc or indium containing amalgams, respectively. A surface layer enriched with indium and oxygen was clearly detected by XPS but not with grazing angle XRD.
The thickness of the enriched surface layer is estimated to be in the order of few nanometer, which is approximately equal to the analysis depth of XPS. In addition, the presence of metallic elements, like tin and zinc, that readily form a stable oxide layer at the surface suppress the release of mercury.
表征牙科汞合金的表面对于理解口腔中汞合金修复体的汞释放过程很重要。汞的蒸发不仅发生在新制作的修复体中,也发生在凝固后的材料中。
对四种凝固良好的不同类型汞合金的表面进行X射线光电子能谱(XPS)和X射线衍射(XRD)分析,并研究表面成分与汞释放之间的关系。使用XPS研究新鲜汞合金表面以及在空气中储存30天的老化表面,并研究汞合金成分和氧的化学状态。老化表面也用XRD和掠角XRD进行表征。
随着氧化程度的增加,所有汞合金中锡和氧的表面含量增加。相比之下,铜和汞的表面含量降低。分别在含锌或铟的汞合金中观察到锌或铟含量增加。通过XPS清楚地检测到富含铟和氧的表面层,但掠角XRD未检测到。
富集表面层的厚度估计在几纳米量级,这大约等于XPS的分析深度。此外,像锡和锌这样容易在表面形成稳定氧化层的金属元素的存在抑制了汞的释放。