Sekioka Tsuguhisa, Hayashi Kouichi, Matsubara Eiichiro, Takahashi Yukio, Hayashi Tetsutaro, Terasawa Mititaka, Mitamura Tohru, Iwase Akihiro, Michikami Osamu
Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan.
J Synchrotron Radiat. 2005 Jul;12(Pt 4):530-3. doi: 10.1107/S0909049505006497. Epub 2005 Jun 15.
X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa(2)Cu(3)O(7-delta) (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.
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