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用双电压法测定脉冲辐射束的离子复合损失

Determination of ion recombination loss by two-voltage method for pulsed radiation beams.

作者信息

Hiraoka T, Hoshino K, Fukumura A, Kawashima K

机构信息

Division of Physics, National Institute of Radiological Sciences, Chiba-shi, Japan.

出版信息

Med Dosim. 1992;17(2):77-82. doi: 10.1016/0958-3947(92)90017-a.

Abstract

The ion recombination loss is one of the most important correction factors for dosimetry using ionization chamber especially for the measurement of high-intensity pulsed radiation beam. The two-voltage method has been used frequently for the correction of ion recombination loss. Several ways to approximate the method are presented. Comparisons were carried out to check the validity of the approximation. Using four ionization chambers of different types and shapes, measurements were made to obtain the optimal value of the ratio for the two voltages.

摘要

离子复合损失是使用电离室进行剂量测定时最重要的校正因子之一,特别是对于高强度脉冲辐射束的测量。双电压法已被频繁用于校正离子复合损失。本文提出了几种近似该方法的途径。进行了比较以检验近似方法的有效性。使用四个不同类型和形状的电离室进行测量,以获得两个电压之比的最佳值。

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