Enhancement of the spin-dependent effect of pi/2-angle Compton scattering using elliptically polarized synchrotron radiation.

Noticeable enhancement of the spin-dependent Compton scattering intensity in right-angle scattering has been achieved by using high-energy X-rays having elliptical polarization. A promising momentum resolution of better than 0.4 atomic units for Compton-profile measurements is firmly predicted by means of an ordinary Ge solid-state detector when the scattering-angle divergence at 90 degrees is crucially restricted. It is pointed out that the angle between a scattering vector and the direction of sample magnetization can be chosen as 90 degrees without seriously weakening the spin-dependent effect. Comparison is made between 274 keV and 122 keV experiments.