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铁磁体-半导体界面处自旋积累的电学检测。

Electrical detection of spin accumulation at a ferromagnet-semiconductor interface.

作者信息

Lou X, Adelmann C, Furis M, Crooker S A, Palmstrøm C J, Crowell P A

机构信息

School of Physics and Astronomy, University of Minnesota, Minneapolis, 55455, USA.

出版信息

Phys Rev Lett. 2006 May 5;96(17):176603. doi: 10.1103/PhysRevLett.96.176603. Epub 2006 May 3.

Abstract

We show that the accumulation of spin-polarized electrons at a forward-biased Schottky tunnel barrier between Fe and -GaAs can be detected electrically. The spin accumulation leads to an additional voltage drop across the barrier that is suppressed by a small transverse magnetic field, which depolarizes the spins in the semiconductor. The dependence of the electrical accumulation signal on magnetic field, bias current, and temperature is in good agreement with the predictions of a drift-diffusion model for spin-polarized transport.

摘要

我们表明,在铁与砷化镓之间正向偏置的肖特基隧道势垒处自旋极化电子的积累可以通过电学方法检测到。自旋积累会导致势垒两端出现额外的电压降,而该电压降会被一个小的横向磁场抑制,该磁场会使半导体中的自旋去极化。电学积累信号对磁场、偏置电流和温度的依赖性与自旋极化输运的漂移扩散模型的预测结果高度吻合。

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