Kida M, Sakiyama Y, Matsuda A, Takabayashi S, Ochi H, Sekiguchi H, Minamitake S, Ariga T
Department of Pediatrics, Hokkaido University Graduate School of Medicine, Sapporo, Japan.
J Dent Res. 2007 Jan;86(1):69-72. doi: 10.1177/154405910708600111.
Amelogenesis imperfecta (AI) is a hereditary disease with abnormal dental enamel formation. Here we report a Japanese family with X-linked AI transmitted over at least four generations. Mutation analysis revealed a novel mutation (p.P52R) in exon 5 of the amelogenin gene. The mutation was detected as heterozygous in affected females and as hemizygous in their affected father. The affected sisters exhibited vertical ridges on the enamel surfaces, whereas the affected father had thin, smooth, yellowish enamel with distinct widening of inter-dental spaces. To study the pathological cause underlying the disease in this family, we synthesized the mutant amelogenin p.P52R protein and evaluated it in vitro. Furthermore, we studied differences in the chemical composition between normal and affected teeth by x-ray diffraction analysis and x-ray fluorescence analysis. We believe that these results will greatly aid our understanding of the pathogenesis of X-linked AI.
釉质发育不全(AI)是一种牙釉质形成异常的遗传性疾病。在此,我们报告一个至少四代遗传的X连锁AI的日本家族。突变分析显示釉原蛋白基因外显子5存在一个新的突变(p.P52R)。该突变在受影响女性中检测为杂合子,在其受影响的父亲中检测为半合子。受影响的姐妹在牙釉质表面呈现垂直嵴,而受影响的父亲牙釉质薄、光滑、发黄,牙间隙明显增宽。为研究该家族疾病的病理原因,我们合成了突变型釉原蛋白p.P52R蛋白并进行体外评估。此外,我们通过X射线衍射分析和X射线荧光分析研究了正常牙齿和患牙之间的化学成分差异。我们相信这些结果将极大地帮助我们理解X连锁AI的发病机制。