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角度相关的Ni2+ X射线磁线性二色性:重新审视界面耦合

Angle-dependent Ni2+ X-ray magnetic linear dichroism: interfacial coupling revisited.

作者信息

Arenholz Elke, van der Laan Gerrit, Chopdekar Rajesh V, Suzuki Yuri

机构信息

Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

出版信息

Phys Rev Lett. 2007 May 11;98(19):197201. doi: 10.1103/PhysRevLett.98.197201. Epub 2007 May 7.

Abstract

Using x-ray magnetic linear dichroism (XMLD) for magnetometry requires detailed knowledge of its dependence on the relative orientation of polarization, magnetic moments, and crystallographic axes. We show that Ni2+ L(2,3) XMLD in cubic lattices has to be described as a linear combination of two fundamental spectra--not one as previously assumed. The spectra are calculated using atomic multiplet theory and the angular dependence is derived from crystal field symmetry. Applying our results to Co/NiO(001) interfaces, we find perpendicular coupling between Ni and Co moments.

摘要

使用X射线磁线性二色性(XMLD)进行磁力测量需要详细了解其对极化、磁矩和晶体轴相对取向的依赖性。我们表明,立方晶格中的Ni2+ L(2,3) XMLD必须被描述为两个基本光谱的线性组合,而不是像之前假设的那样是一个光谱。这些光谱是使用原子多重态理论计算的,角度依赖性是从晶体场对称性推导出来的。将我们的结果应用于Co/NiO(001)界面,我们发现Ni和Co磁矩之间存在垂直耦合。

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