Golant K M, Lavrishchev S V, Popov A V, Artyukov I A, Feshchenko R M, Mitrofanov A N, Vinogradov A V
Fiber Optics Research Center, RAS, 38 Vavilov Street, 119333 Moscow, Russia.
Appl Opt. 2007 Aug 10;46(23):5964-6. doi: 10.1364/ao.46.005964.
A new cost-efficient sputter-slice technology for hard x-ray (10-30 keV) Fresnel zone plates fabrication, imposing no limitation to aspect ratio, is proposed. By means of a plasma chemical process, SiO(2)/Si(1-x)Ge(x)O(2) glassy film multilayer structures are deposited on a lateral surface of a silica rod, outermost layers being as thin as 100 nm. It has been shown by numerical simulation that for x=0.2 germanium fraction, 100-300 microm zone plate thickness and the number of zones of about 1000, first order diffraction efficiency as high as 20%-30% at the energy of approximately 20 keV can be achieved.
提出了一种用于制造硬X射线(10 - 30 keV)菲涅耳波带片的新型具有成本效益的溅射切片技术,该技术对纵横比没有限制。通过等离子体化学过程,在石英棒的侧面沉积SiO(2)/Si(1 - x)Ge(x)O(2)玻璃膜多层结构,最外层薄至100 nm。数值模拟表明,对于锗含量x = 0.2、波带片厚度为100 - 300微米且区带数量约为1000的情况,在约20 keV的能量下可实现高达20% - 30%的一阶衍射效率。