Mingard K P, Roebuck B, Bennett E G, Thomas M, Wynne B P, Palmiere E J
National Physical Laboratory, Division of Engineering and Process Control, Hampton Road, Teddington, Middlesex, TW11 0LW, UK.
J Microsc. 2007 Sep;227(Pt 3):298-308. doi: 10.1111/j.1365-2818.2007.01814.x.
The measurement of grain size by EBSD has been studied to enable representative quantification of the microstructure of hot deformed metal alloys with a wide grain size distributions. Variation in measured grain size as a function of EBSD step size and noise reduction techniques has been assessed. Increasing the EBSD step size from 5% to 20% of the approximate mean grain size results in a change in calculated arithmetic mean grain size of approximately 15% and standard noise reduction techniques can produce a further change in reported size of up to 20%. The distribution of measured grain size is found not to be log-normal, with a long tail of very small sizes in agreement with a computer simulation of linear intercept and areal grain size measurements through randomly oriented grains. Comparison of EBSD with optical measurements of grain size on the same samples shows that, because of the ability of EBSD to distinguish twins and resolve much smaller grains a difference of up to 50% in measured grain size results.
通过电子背散射衍射(EBSD)测量晶粒尺寸已得到研究,以便能够对具有广泛晶粒尺寸分布的热变形金属合金的微观结构进行具有代表性的量化。已评估了测量的晶粒尺寸随EBSD步长和降噪技术的变化情况。将EBSD步长从近似平均晶粒尺寸的5%增加到20%,会导致计算出的算术平均晶粒尺寸变化约15%,而标准降噪技术可使报告的尺寸进一步变化高达20%。发现测量的晶粒尺寸分布不是对数正态分布,存在非常小尺寸的长尾,这与通过随机取向晶粒进行的线性截距和面积晶粒尺寸测量的计算机模拟结果一致。对相同样品上EBSD与晶粒尺寸光学测量结果的比较表明,由于EBSD能够区分孪晶并分辨小得多的晶粒,导致测量的晶粒尺寸相差高达50%。