重复测量数据中随机缺失值的检验。
Testing for random dropouts in repeated measurement data.
作者信息
Ridout M S
机构信息
Horticulture Research International, West Malling, Kent, United Kingdom.
出版信息
Biometrics. 1991 Dec;47(4):1617-9; discussion 1619-21.
PMID:1786335
Abstract
Diggle (1989, Biometrics 45, 1255-1258) proposes a test for random dropouts in repeated measurement data when the experiment has a completely randomized design. It is argued here that logistic regression is a comparable but more flexible technique for studying the occurrence of dropouts.
摘要
迪格尔（1989年，《生物统计学》45卷，第1255 - 1258页）提出了一种用于重复测量数据中随机失访情况的检验方法，该方法适用于实验采用完全随机设计的情况。本文认为，逻辑回归是一种与之可比但更为灵活的研究失访发生情况的技术。
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