Nano-pulsed laser irradiation scanning system for phase-change materials.

Recently, the demand of a laser irradiation tester is increasing for phase change random access memory (PRAM) as well as conventional optical storage media. In this study, a nano-pulsed laser irradiation system is developed to characterize the optical property and writing performance of phase-change materials, based on a commercially available digital versatile disk (DVD) optical pick-up. The precisely controlled focusing and scanning on the material's surface are implemented using the auto-focusing mechanism and a voice coil motor (VCM) of the commercial DVD pick-up. The laser irradiation system provides various writing and reading functions such as adjustable laser power, pulse duration, recording pattern (spot, line and area), and writing/reading repetition, phase transition, and in situ reflectivity measurement before/after irradiation. Measurements of power time effect (PTE) diagram and reflectivity map of Ge(2)Sb(2)Te(5) samples show that the proposed laser irradiation system provides the powerful scanning tool to quantify the optical characteristics of phase-change materials.