Winkelmann Aimo
Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120 Halle, Germany.
Ultramicroscopy. 2008 Nov;108(12):1546-50. doi: 10.1016/j.ultramic.2008.05.002. Epub 2008 May 16.
We present a model which describes the appearance of excess and deficiency features in electron backscatter diffraction (EBSD) patterns and we show how to include this effect in many-beam dynamical simulations of EBSD. The excess and deficiency features appear naturally if we take into account the anisotropy of the internal source of inelastically scattered electrons which are subsequently scattered elastically to produce the EBSD pattern. The results of simulations applying this model show very good agreement with experimental patterns. The amount of the excess-deficiency asymmetry of the Kikuchi bands depends on their relative orientation with respect to the incident beam direction. In addition, higher order Laue zone rings are also influenced by the same effect.
我们展示了一个描述电子背散射衍射(EBSD)图案中多余和缺失特征出现情况的模型,并说明了如何将这种效应纳入EBSD的多束动力学模拟中。如果我们考虑非弹性散射电子内部源的各向异性,这些非弹性散射电子随后发生弹性散射以产生EBSD图案,那么多余和缺失特征就会自然出现。应用该模型的模拟结果与实验图案显示出非常好的一致性。菊池带的多余-缺失不对称量取决于它们相对于入射束方向的相对取向。此外,高阶劳厄区环也受到相同效应的影响。