Capoulade Jérémie, Gallais Laurent, Natoli Jean-Yves, Commandré Mireille
Institut Fresnel (UMR CNRS 6133), Université Aix Marseille, Ecole Centrale Marseille, Domaine Universitaire de St Jérôme, 13397 Marseille Cedex 20, France.
Appl Opt. 2008 Oct 10;47(29):5272-80. doi: 10.1364/ao.47.005272.
We have investigated the influence of laser beam size on laser-induced damage threshold (LIDT) in the case of single- and multiple-shot irradiation. The study was performed on hafnia thin films deposited with various technologies (evaporation, sputtering, with or without ion assistance). LIDT measurements were carried out at 1064 nm and 12 ns with a spot size ranging from a few tens to a few hundreds of micrometers, in 1-on-1 and R-on-1 modes. These measurements were compared with simulations obtained with the statistical theory of laser-induced damage caused by initiating inclusions. We show how to obtain information on the initiating defect properties and the related physical damage mechanisms with a multiscale study. Under certain conditions, it is possible with this method to discriminate different defects, estimate their densities, and follow the evolution of the defects under multiple irradiation. The different metrology implications of our approach, particularly for obtaining a functional LIDT of optical components are discussed.
我们研究了在单次和多次照射情况下激光束尺寸对激光诱导损伤阈值(LIDT)的影响。该研究是在采用各种技术(蒸发、溅射,有无离子辅助)沉积的氧化铪薄膜上进行的。LIDT测量是在1064nm波长、12ns脉宽下进行的,光斑尺寸范围从几十微米到几百微米,采用1对1和R对1模式。这些测量结果与通过引发夹杂物导致激光诱导损伤的统计理论获得的模拟结果进行了比较。我们展示了如何通过多尺度研究获得关于引发缺陷特性和相关物理损伤机制的信息。在某些条件下,用这种方法可以区分不同的缺陷,估计它们的密度,并跟踪多次照射下缺陷的演变。我们还讨论了该方法的不同计量学意义,特别是对于获得光学元件的功能LIDT。