外延（001）BiFeO₃薄膜中的应变诱导极化旋转。
Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films.
作者信息
Jang H W, Baek S H, Ortiz D, Folkman C M, Das R R, Chu Y H, Shafer P, Zhang J X, Choudhury S, Vaithyanathan V, Chen Y B, Felker D A, Biegalski M D, Rzchowski M S, Pan X Q, Schlom D G, Chen L Q, Ramesh R, Eom C B
机构信息
Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706, USA.
出版信息
Phys Rev Lett. 2008 Sep 5;101(10):107602. doi: 10.1103/PhysRevLett.101.107602. Epub 2008 Sep 4.
Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.
对高质量（001）取向的外延BiFeO₃薄膜剩余极化的直接测量表明，其具有很强的应变依赖性，甚至比传统的（001）取向的PbTiO₃薄膜还要大。热力学分析表明，应变诱导的极化旋转机制是导致（001）BiFeO₃薄膜面外极化随双轴应变发生巨大变化的原因，而自发极化本身几乎保持不变。
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