Banno Michiko, Tamiya Eiichi, Takamura Yuzuru
School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1292, Japan.
Anal Chim Acta. 2009 Feb 23;634(2):153-7. doi: 10.1016/j.aca.2008.12.021. Epub 2008 Dec 24.
This paper describes a quantitative measurement of trace elements (Na, Li) in high purity zirconium dioxide powder using liquid electrode plasma optical emission spectrometry (LEP-OES). Conventionally, for such type of measurements, inductively coupled plasma optical emission spectrometry (ICP-OES) is frequently employed. The detection limits of elements in zirconium by ICP-OES are degraded due to the spectra interference between the trace elements and zirconium of the matrix, because zirconium is a line rich element in spectra obtained by ICP-OES. LEP-OES is an elemental analysis method developed by the authors. The measurement principle is simple, as follows. Sample solution is put into a narrow channel on a small cuvette and voltage pulse is applied from both ends of the channel. At the center of the channel which is made narrower, the voltage and current are concentrated there, and plasma is generated. From the emission of the plasma, the quantitative analysis of the elements in the solution is achieved. The LEP-OES has the property that the emission of zirconium is relatively weak, so that highly sensitive measurement of trace elements in zirconium matrix can be conducted without interference. Sample solution is prepared by dissolving high purity zirconium dioxide powder and trace amounts of Na or Li with sulfuric acid. The voltage dependence and the pulse width dependence of optical emission spectra are also investigated. With increase of the voltage or the pulse width, the ratio of emission intensities of Na to those of hydrogen increases. This suggests that the ratio of sensitivity of two elements is variable, that means the element selectivity is controllable to some extent by the measurement conditions in LEP-OES. In the case of Na and H, the ratio can be controlled from 7.4 to 21.6%. Finally, the detection limits (3S.D.) of the trace elements, Na and Li, in 4000 microg g(-1) zirconium dioxide aqueous solution are found to be 0.02 and 0.133 microg g(-1), respectively. These values correspond to 5 microg g(-1) for Na, 33.25 microg g(-1) for Li in original high purity zirconium dioxide powder. The correlation coefficient of calibration curve was 0.995 for Na, 0.985 for Li. Those are comparable to the literature values of detection limits using ICP-OES.
本文描述了使用液体电极等离子体发射光谱法(LEP - OES)对高纯二氧化锆粉末中的微量元素(钠、锂)进行定量测量。传统上,对于此类测量,经常采用电感耦合等离子体发射光谱法(ICP - OES)。由于基体中的微量元素与锆之间存在光谱干扰,ICP - OES对锆中元素的检测限会降低,因为锆是ICP - OES获得的光谱中的谱线丰富元素。LEP - OES是作者开发的一种元素分析方法。其测量原理很简单,如下所述。将样品溶液放入小比色皿上的狭窄通道中,并从通道两端施加电压脉冲。在变窄的通道中心,电压和电流集中于此,从而产生等离子体。通过等离子体的发射,实现对溶液中元素的定量分析。LEP - OES具有锆的发射相对较弱的特性,因此可以在无干扰的情况下对锆基体中的微量元素进行高灵敏度测量。通过用硫酸溶解高纯二氧化锆粉末和痕量的钠或锂来制备样品溶液。还研究了光发射光谱的电压依赖性和脉冲宽度依赖性。随着电压或脉冲宽度的增加,钠与氢的发射强度之比增加。这表明两种元素的灵敏度之比是可变的,也就是说在LEP - OES中,元素选择性在一定程度上可通过测量条件来控制。对于钠和氢的情况,该比值可从7.4%控制到21.6%。最后,发现在4000 μg g⁻¹二氧化锆水溶液中微量元素钠和锂的检测限(3S.D.)分别为0.02和0.133 μg g⁻¹。这些值对应于原始高纯二氧化锆粉末中钠为5 μg g⁻¹,锂为33.25 μg g⁻¹。钠校准曲线的相关系数为0.995,锂校准曲线的相关系数为0.985。这些与使用ICP - OES的检测限文献值相当。