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使用商用透射电子显微镜对II型超导体中的磁通涡旋进行成像。

Imaging flux vortices in type II superconductors with a commercial transmission electron microscope.

作者信息

Loudon J C, Midgley P A

机构信息

Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK.

出版信息

Ultramicroscopy. 2009 May;109(6):700-29. doi: 10.1016/j.ultramic.2009.01.008. Epub 2009 Feb 14.

Abstract

Flux vortices in superconductors can be imaged using transmission electron microscopy because the electron beam is deflected by the magnetic flux associated with the vortices. This technique has a better spatial and temporal resolution than many other imaging techniques and is sensitive to the magnetic flux density within each vortex, not simply the fields at the sample surface. Despite these advantages, only two groups have successfully employed the technique using specially adapted instruments. Here we demonstrate that vortices can be imaged with a modern, commercial transmission electron microscope operating at 300kV equipped with a field emission gun, Lorentz lens and a liquid helium cooled sample holder. We introduce superconductivity for non-specialists and discuss techniques for simulating and optimising images of flux vortices. Sample preparation is discussed in detail as the main difficulty with the technique is the requirement for samples with very large (>10microm), flat areas so that the image is not dominated by diffraction contrast. We have imaged vortices in superconducting Bi(2)Sr(2)CaCu(2)O(8-delta) and use correlation functions to investigate the ordered arrangements they adopt as a function of applied magnetic field.

摘要

由于电子束会被与涡旋相关的磁通量偏转,因此可以使用透射电子显微镜对超导体中的磁通涡旋进行成像。该技术比许多其他成像技术具有更好的空间和时间分辨率,并且对每个涡旋内的磁通密度敏感,而不仅仅是对样品表面的磁场敏感。尽管有这些优点,但只有两个研究小组使用经过特殊改装的仪器成功应用了该技术。在这里,我们证明了可以使用配备场发射枪、洛伦兹透镜和液氦冷却样品架的300kV现代商用透射电子显微镜对涡旋进行成像。我们向非专业人士介绍超导性,并讨论模拟和优化磁通涡旋图像的技术。详细讨论了样品制备,因为该技术的主要困难在于需要具有非常大(>10微米)平坦区域的样品,以便图像不会被衍射对比度主导。我们对超导Bi(2)Sr(2)CaCu(2)O(8-δ)中的涡旋进行了成像,并使用相关函数来研究它们作为外加磁场函数所采用的有序排列。

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