Astakhov G V, Hoffmann H, Korenev V L, Kiessling T, Schwittek J, Schott G M, Gould C, Ossau W, Brunner K, Molenkamp L W
Physikalisches Institut (EP3), Universität Würzburg, 97074 Würzburg, Germany.
Phys Rev Lett. 2009 May 8;102(18):187401. doi: 10.1103/PhysRevLett.102.187401. Epub 2009 May 4.
We report a photoinduced change of the coercive field, i.e., a photocoercivity effect (PCE), under very low intensity illumination of a low-doped (Ga,Mn)As ferromagnetic semiconductor. We find a strong correlation between the PCE and the sample resistivity. Spatially resolved dynamics of the magnetization reversal rule out any role of thermal heating in the origin of this PCE, and we propose a mechanism based on the light-induced lowering of the domain wall pinning energy. The PCE is local and reversible, allowing writing and erasing of magnetic images using light.
我们报道了在低掺杂(Ga,Mn)As铁磁半导体的极低强度光照下,矫顽场的光致变化,即光致矫顽力效应(PCE)。我们发现PCE与样品电阻率之间存在很强的相关性。磁化反转的空间分辨动力学排除了热加热在该PCE起源中的任何作用,并且我们提出了一种基于光致降低畴壁钉扎能的机制。PCE是局部的且可逆的,允许使用光写入和擦除磁图像。