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利用直流提取场从线性离子阱中进行质量选择性轴向喷射。

Mass-selective axial ejection from a linear ion trap with a direct current extraction field.

作者信息

Sugiyama Masuyuki, Hasegawa Hideki, Hashimoto Yuichiro

机构信息

Central Research Laboratory, Hitachi, Ltd., Tokyo, Japan.

出版信息

Rapid Commun Mass Spectrom. 2009 Sep;23(18):2917-22. doi: 10.1002/rcm.4204.

Abstract

We have developed a new mass-selective axial ejection method from a linear ion trap (LIT). In this method, a set consisting of a trap wire lens and an extraction wire lens positioned orthogonally to each other was placed between quadrupole rods. The trap wire lens confines the ions inside the trap, and the extraction wire axially extracts ions from the trap. Ions introduced into the LIT are trapped between the inlet lens and the trap wire lens. In addition to the wire lenses, a set of excitation lenses, which are aligned orthogonally to the trap wire lens, are inserted between rods. The ions are resonantly excited in the direction perpendicular to the trap wire lens by applying a supplemental alternating current (AC) to the excitation lenses. Excited ions with a large motion pass over the trap wire lens, while unexcited ions remain trapped inside. Ions that have passed over the trap wire lens are then extracted by the extraction wire lens. The characteristics of the mass-selective ejection with a direct current (DC) extraction field were investigated by both simulation and experiment. A mass resolving power of m/Deltam = 1300 was achieved at a scan rate of 500 Th/s. The dependence of the ejection efficiency on trap wire lens bias was measured, and an ejection efficiency of 20% at a scan rate of 500 Th/s was achieved by optimizing the DC bias on the trap wire lens.

摘要

我们开发了一种从线性离子阱(LIT)进行质量选择轴向喷射的新方法。在该方法中,由相互正交放置的阱线透镜和提取线透镜组成的装置被置于四极杆之间。阱线透镜将离子限制在阱内,而提取线从阱中轴向提取离子。引入到LIT中的离子被困在入口透镜和阱线透镜之间。除了线透镜外,一组与阱线透镜正交排列的激发透镜也插入到杆之间。通过向激发透镜施加补充交流电(AC),离子在垂直于阱线透镜的方向上被共振激发。运动幅度大的被激发离子越过阱线透镜,而未被激发的离子仍被困在阱内。越过阱线透镜的离子随后被提取线透镜提取。通过模拟和实验研究了具有直流(DC)提取场的质量选择喷射的特性。在500 Th/s的扫描速率下实现了m/Δm = 1300的质量分辨能力。测量了喷射效率对阱线透镜偏压的依赖性,通过优化阱线透镜上的直流偏压,在500 Th/s的扫描速率下实现了20%的喷射效率。

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