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理解共价硅与离子型氧化铝之间的清晰界面。

Understanding the clean interface between covalent Si and ionic Al2O3.

作者信息

Xiang H J, Da Silva Juarez L F, Branz Howard M, Wei Su-Huai

机构信息

National Renewable Energy Laboratory, Golden, Colorado 80401, USA.

出版信息

Phys Rev Lett. 2009 Sep 11;103(11):116101. doi: 10.1103/PhysRevLett.103.116101. Epub 2009 Sep 9.

Abstract

The atomic and electronic structures of the (001)-Si/(001)-gamma-Al(2)O(3) heterointerface are investigated by first principles total energy calculations combined with a newly developed "modified basin-hopping" method. It is found that all interface Si atoms are fourfold coordinated due to the formation of Si-O and unexpected covalent Si-Al bonds in the new abrupt interface model. And the interface has perfect electronic properties in that the unpassivated interface has a large LDA band gap and no gap levels. These results show that it is possible to have clean semiconductor-oxide interfaces.

摘要

通过结合新开发的“改进盆地跳跃”方法的第一性原理总能量计算,研究了(001)-Si/(001)-γ-Al₂O₃异质界面的原子和电子结构。发现在新的突变界面模型中,由于Si-O键和意外的共价Si-Al键的形成,所有界面Si原子都是四配位的。并且该界面具有完美的电子性质,即未钝化的界面具有较大的LDA带隙且没有带隙能级。这些结果表明,有可能获得清洁的半导体-氧化物界面。

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