Major János, Vorobiev Alexei, Rühm Adrian, Maier Ralf, Major Márton, Mezger Markus, Nülle Max, Dosch Helmut, Felcher Gian P, Falus Péter, Keller Thomas, Pynn Roger
Max-Planck-Institut für Metallforschung, Heisenbergstr. 3, D-70569 Stuttgart, Germany.
Rev Sci Instrum. 2009 Dec;80(12):123903. doi: 10.1063/1.3240598.
We present a dedicated experimental spin-echo resolved grazing incidence scattering (SERGIS) setup for the investigation of surfaces and thin films exhibiting large lateral length scales. This technique uses the neutron spin to encode one in-plane component of the wave-vector transfer in a grazing angle scattering experiment. Instead of the scattering angle, the depolarization of the scattered beam is measured. This allows one to achieve a very high in-plane momentum resolution without collimation of the incident neutron beam in the corresponding direction. SERGIS can therefore offer an alternative or complementary method to conventional grazing incidence neutron scattering experiments. We describe the experimental setup installed at the neutron sources ILL (Grenoble) and FRM II (Garching) and present data obtained with this setup on various samples exhibiting characteristic mesoscopic length scales in the range of several hundred nanometers. We also derive general formulas and error margins for the analysis and interpretation of SERGIS data and apply them to the cases of a one-dimensional structure and of an island morphology.
我们展示了一种专门用于研究具有大横向长度尺度的表面和薄膜的实验性自旋回波分辨掠入射散射(SERGIS)装置。该技术利用中子自旋在掠角散射实验中对波矢转移的一个面内分量进行编码。测量的是散射束的退极化,而不是散射角。这使得在相应方向上无需对入射中子束进行准直就能实现非常高的面内动量分辨率。因此,SERGIS可以为传统掠入射中子散射实验提供一种替代或补充方法。我们描述了安装在中子源ILL(格勒诺布尔)和FRM II(加兴)的实验装置,并展示了用该装置在各种具有几百纳米范围内特征介观长度尺度的样品上获得的数据。我们还推导了用于分析和解释SERGIS数据的通用公式和误差范围,并将其应用于一维结构和岛状形态的情况。