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Real-time slope mapping and defect detection in bent plates using Talbot interferometry.

作者信息

Trivedi Satya Prakash, Prakash Shashi, Rana Santosh, Sasaki Osami

机构信息

Photonics Laboratory, Department of Electronics and Instrumentation Engineering, Institute of Engineering & Technology, Devi Ahilya University, Khandwa Road, Indore 452017, India.

出版信息

Appl Opt. 2010 Feb 10;49(5):897-903. doi: 10.1364/AO.49.000897.

Abstract

We demonstrate a simple method for obtaining slope contours of bent plates using Talbot interferometry. The technique has been used to map slope contours of polymethyl methacrylate specimens of different shapes. The Talbot image of a coarse grating is projected onto a specimen such that the self-image is backreflected onto the same grating again. As a Talbot interferometer is basically a grating shearing interferometer, it results in the generation of characteristic slope maps of the specimen under test. Results of the investigation match well with other slope-mapping techniques. Validation of experimental results with theoretical predictions in the case of a cantilever beam specimen has been undertaken. Accuracy of about 4.7% with respect to theoretical predictions is obtained.

摘要

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