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利用激光二极管通过波长偏移干涉测量法进行绝对距离测量:一些系统误差源。

Absolute distance measurement by wavelength shift interferometry with a laser diode: some systematic error sources.

作者信息

Kikuta H, Iwata K, Nagata R

出版信息

Appl Opt. 1987 May 1;26(9):1654-60. doi: 10.1364/AO.26.001654.

Abstract

A method for measuring absolute distance by the wavelength shift of laser diode light has previously been proposed. In this work three serious systematic error sources for the method are discussed and some of the discussion is confirmed by experiment. The error sources are optical feedback effect, longitudinal mode distribution of laser light, and unwanted light reflected from optical devices (coherent noise). The optical feedback effect influences the wavelength shift of the emitted light. The mode distribution causes the periodic error dependent on the measured distance, and the maximum error is determined by the change in the intensity ratio of the submodes to the main mode. Coherent noise causes the periodic error also dependent on the distance, and the maximum error is determined by the amplitude ratio of the measuring lightwave to the noise. These systematic errors are observed in some demonstrative experiments.

摘要

此前已提出一种利用激光二极管光的波长偏移来测量绝对距离的方法。在这项工作中,讨论了该方法的三个严重系统误差源,并且部分讨论通过实验得到了证实。这些误差源是光反馈效应、激光的纵向模式分布以及从光学器件反射的杂散光(相干噪声)。光反馈效应会影响发射光的波长偏移。模式分布会导致与测量距离相关的周期性误差,并且最大误差由子模式与主模式的强度比变化决定。相干噪声也会导致与距离相关的周期性误差,并且最大误差由测量光波与噪声的幅度比决定。在一些演示实验中观察到了这些系统误差。

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