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D3+ 离子与电子的二元和三元复合的温度依赖性。

Temperature dependence of binary and ternary recombination of D3+ ions with electrons.

机构信息

Faculty of Mathematics and Physics, Charles University, 12116 Prague, Czech Republic.

出版信息

J Chem Phys. 2010 Jul 21;133(3):034305. doi: 10.1063/1.3457940.

Abstract

Flowing and stationary afterglow experiments were performed to study the recombination of D(3)(+) ions with electrons at temperatures from 77 to 300 K. A linear dependence of apparent (effective) binary recombination rate coefficients on the pressure of the helium buffer gas was observed. Binary (D(3)(+)+e(-)) and ternary (D(3)(+)+e(-)+He) recombination rate coefficients were derived. The obtained binary rate coefficient agrees with recent theoretical values for dissociative recombination of D(3)(+). We describe the observed ternary process by a mechanism with two rate determining steps. In the first step, a rotationally excited long-lived neutral D(3)* is formed in D(3)(+)-e(-) collisions. As the second step, the D(3)* collides with a helium atom that prevents autoionization of D(3). We calculate lifetimes of D(3) formed from ortho-, para-, or metastates of D(3)(+) and use the lifetimes to calculate ternary recombination rate coefficients.

摘要

进行了流动和静态余晖实验,以研究温度在 77 至 300 K 时 D(3)(+)离子与电子的复合。观察到表观(有效)二元复合率系数与氦缓冲气体压力呈线性关系。推导出了二元(D(3)(+)+e(-))和三元(D(3)(+)+e(-)+He)复合率系数。获得的二元率系数与 D(3)(+)的离解复合的最新理论值相符。我们通过具有两个速率决定步骤的机制描述了观察到的三元过程。在第一步中,在 D(3)(+)-e(-)碰撞中形成旋转激发的长寿命中性 D(3)*。作为第二步,D(3)*与氦原子碰撞,防止 D(3)*的自电离。我们计算了由 D(3)(+)的正、仲或亚稳态形成的 D(3)*的寿命,并使用这些寿命来计算三元复合率系数。

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