Cordingley J
Appl Opt. 1993 May 10;32(14):2538-42. doi: 10.1364/AO.32.002538.
Laser repair of dynamic random-access memories is commercially significant at the 1-Mbit density and larger. The window of acceptable laser parameters required to repair these parts typically decreases with each successive device generation because of increased variations in oxide thickness. A simple single-zone binary optic was developed to modify the beam profile from Gaussian to flattop. Experiments performed on actual dynamic random-access memory parts verified a large increase in the laser energy process window because of the shaped beam profile.