Chapman H N, Rodé A, Nugent K A, Wilkins S W
Appl Opt. 1993 Nov 1;32(31):6333-40. doi: 10.1364/AO.32.006333.
A microchannel plate (MCP) detector blank has been used to focus x rays of 0.154-, 0.62-, and 0.84-nm wavelength generated by a microfocus x-ray tube and a laser-produced plasma. The focusing effect of MCP's arises from total external reflection of x rays at the interior channel surfaces. Measurements of the intensity profiles of the images formed by the MCP have been made and compared with the predictions of a detailed model developed in Part I. [Appl. Opt. 32, 6316 (1993)]. It was found that the model gives a reliable description of the data. A consistent set of parameters was found from fits to the data at all three wavelengths.
一个微通道板(MCP)探测器坯件已被用于聚焦由微焦点X射线管和激光产生的等离子体产生的波长为0.154纳米、0.62纳米和0.84纳米的X射线。MCP的聚焦效应源于X射线在内部通道表面的全外反射。已对MCP形成的图像的强度分布进行了测量,并与第一部分[《应用光学》32,6316(1993)]中开发的详细模型的预测进行了比较。发现该模型对数据给出了可靠的描述。通过对所有三个波长的数据拟合,找到了一组一致的参数。