Levy Etgar C, Okusaga Olukayode, Horowitz Moshe, Menyuk Curtis R, Zhou Weimin, Carter Gary M
Department of Electrical Engineering, Technion - Israel Institute of Technology, Haifa 32000, Israel.
Opt Express. 2010 Sep 27;18(20):21461-76. doi: 10.1364/OE.18.021461.
We describe a comprehensive computational model for singleloop and dual-loop optoelectronic oscillators (OEOs). The model takes into account the dynamical effects and noise sources that are required to accurately model OEOs. By comparing the computational and experimental results in a single-loop OEO, we determined the amplitudes of the white noise and flicker noise sources. We found that the flicker noise source contains a strong component that linearly depends on the loop length. Therefore, the flicker noise limits the performance of long-cavity OEOs (≧5 km) at low frequencies (f<500 Hz). The model for a single-loop OEO was extended to model the dual-loop injection-locked OEO (DIL-OEO). The model gives the phase-noise, the spur level, and the locking range of each of the coupled loops in the OEO. An excellent agreement between theory and experiment is obtained for the DIL-OEO. Due to its generality and accuracy, the model is important for both designing OEOs and studying the physical effects that limit their performance. We demonstrate theoretically that it is possible to reduce the first spur in the DIL-OEO by more than 20 dB relative to its original performance by changing its parameters. This theoretical result has been experimentally verified.
我们描述了一种用于单环和双环光电振荡器(OEO)的综合计算模型。该模型考虑了精确建模OEO所需的动态效应和噪声源。通过比较单环OEO的计算结果和实验结果,我们确定了白噪声和闪烁噪声源的幅度。我们发现,闪烁噪声源包含一个与环路长度线性相关的强分量。因此,闪烁噪声在低频(f<500Hz)时限制了长腔OEO(≧5km)的性能。单环OEO模型被扩展以对双环注入锁定OEO(DIL-OEO)进行建模。该模型给出了OEO中每个耦合环路的相位噪声、杂散电平以及锁定范围。对于DIL-OEO,理论与实验取得了极好的一致性。由于其通用性和准确性,该模型对于设计OEO以及研究限制其性能的物理效应都很重要。我们从理论上证明,通过改变DIL-OEO的参数,可以使其第一杂散相对于其原始性能降低超过20dB。这一理论结果已得到实验验证。