Centro de Biología Molecular Severo Ochoa, Consejo Superior de Investigaciones Científicas, Universidad Autónoma de Madrid, Lab. 107, C/Nicolás Cabrera, 1, Cantoblanco, 28049 Madrid, Spain.
Biochem Biophys Res Commun. 2010 Nov 12;402(2):324-8. doi: 10.1016/j.bbrc.2010.10.025. Epub 2010 Oct 15.
The differential expression levels of T-cell intracellular antigens (TIA) and Hu antigen R (HuR) are concomitant with a splicing switch in apoptosis receptor Fas in HCT-116 cells. Thus, overexpression and knockdown of HuR led to Fas exon 6 skipping and inclusion, respectively. These results suggest that the TIA and HuR cellular ratio influences cell-type specific Fas exon 6 splicing pattern.
T 细胞内抗原(TIA)和 Hu 抗原 R(HuR)的差异表达水平与 HCT-116 细胞中凋亡受体 Fas 的剪接转换同时发生。因此,HuR 的过表达和敲低分别导致 Fas 外显子 6 的跳跃和包含。这些结果表明,TIA 和 HuR 细胞比率影响细胞类型特异性 Fas 外显子 6 的剪接模式。