Kang K I, Chang T G, Glesk I, Prucnal P R
Appl Opt. 1996 Mar 20;35(9):1485-8. doi: 10.1364/AO.35.001485.
The nonlinear index of refraction in a resonant region has been determined by the use of a fiber-based Mach--Zehnder interferometer to measure the temporal fringe shift between two signals. The measurement technique is direct and does not require additional amplitude information for the extraction of the nonlinear index of refraction. This technique has been used to measure the temporal response of an InGaAsP semiconductor optical amplifier at 1.313 µm.
通过使用基于光纤的马赫-曾德尔干涉仪来测量两个信号之间的时间条纹移动,已确定了谐振区域中的非线性折射率。该测量技术是直接的,并且在提取非线性折射率时不需要额外的幅度信息。此技术已用于测量1.313μm波长下InGaAsP半导体光放大器的时间响应。