Fukamachi Tomoe, Hirano Kenji, Negishi Riichirou, Kanematsu Yoshinobu, Jongsukswat Sukswat, Hirano Keiichi, Kawamura Takaaki
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293, Japan.
Acta Crystallogr A. 2011 Mar;67(Pt 2):154-9. doi: 10.1107/S0108767310051573. Epub 2011 Jan 26.
Interference fringes in multiple Bragg-Laue mode have been measured from the lateral surface of an Si plane-parallel crystal by changing the distance L between the incident point of X-rays and the crystal edge for two sample crystals with different thicknesses H. The period of the interference fringes becomes large when the distance L becomes large or the thickness H becomes small. When the ratio L/H is larger than 15, a shorter period of oscillation appears in addition to the interference fringes. These variations are explained by considering the beams in multiple Bragg-Laue modes based on the dynamical theory of diffraction. When L/H is less than 15, the measured fringes are well reproduced by taking account of interference between beams in the Bragg-Laue and the Bragg-Bragg-Laue modes. The short period of the oscillations observed for L/H > 15 is reproduced by adding the intensities of the beams in higher-order Bragg-Laue mode. The interference fringes calculated by taking the visibility into account show good agreement with the measured ones.
通过改变X射线入射点与晶体边缘之间的距离L,针对两块不同厚度H的样品晶体,从硅平面平行晶体的侧面测量了多布拉格-劳厄模式下的干涉条纹。当距离L增大或厚度H减小时,干涉条纹的周期变大。当L/H比大于15时,除了干涉条纹外还会出现较短周期的振荡。基于衍射动力学理论,通过考虑多布拉格-劳厄模式下的光束来解释这些变化。当L/H小于15时,通过考虑布拉格-劳厄模式和布拉格-布拉格-劳厄模式下光束之间的干涉,可以很好地重现测量到的条纹。对于L/H > 15时观察到的短周期振荡,通过添加高阶布拉格-劳厄模式下光束的强度来重现。考虑可见度计算得到的干涉条纹与测量条纹显示出良好的一致性。