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高能线性加速器周围的中子诱导电子故障。

Neutron-induced electronic failures around a high-energy linear accelerator.

机构信息

Department of Radiation Physics, M. D. Anderson Cancer Center, The University of Texas, 1515 Holcombe Boulevard, Houston, Texas 77030, USA.

出版信息

Med Phys. 2011 Jan;38(1):34-9. doi: 10.1118/1.3519905.

Abstract

PURPOSE

After a new in-vault CT-on-rails system repeatedly malfunctioned following use of a high-energy radiotherapy beam, we investigated the presence and impact of neutron radiation on this electronic system, as well as neutron shielding options.

METHODS

We first determined the CT scanner's failure rate as a function of the number of 18 MV monitor units (MUs) delivered. We then re-examined the failure rate with both 2.7-cm-thick and 7.6-cm-thick borated polyethylene (BPE) covering the linac head for neutron shielding. To further examine shielding options, as well as to explore which neutrons were relevant to the scanner failure, Monte Carlo simulations were used to calculate the neutron fluence and spectrum in the bore of the CT scanner. Simulations included BPE covering the CT scanner itself as well as covering the linac head.

RESULTS

We found that the CT scanner had a 57% chance of failure after the delivery of 200 MUs. While the addition of neutron shielding to the accelerator head reduced this risk of failure, the benefit was minimal and even 7.6 cm of BPE was still associated with a 29% chance of failure after the delivery of 200 MU. This shielding benefit was achieved regardless of whether the linac head or CT scanner was shielded. Additionally, it was determined that fast neutrons were primarily responsible for the electronic failures.

CONCLUSIONS

As illustrated by the CT-on-rails system in the current study, physicists should be aware that electronic systems may be highly sensitive to neutron radiation. Medical physicists should therefore monitor electronic systems that have not been evaluated for potential neutron sensitivity. This is particularly relevant as electronics are increasingly common in the therapy vault and newer electronic systems may exhibit increased sensitivity.

摘要

目的

在使用高能放射治疗射线后,一种新的轨道式 CT 机反复出现故障,我们研究了这种电子系统中存在的中子辐射及其影响,以及中子屏蔽选项。

方法

我们首先确定了 CT 扫描仪的故障率与 18MV 监测单位(MU)数量的关系。然后,我们用 2.7 厘米和 7.6 厘米厚的含硼聚乙烯(BPE)覆盖直线加速器机头来进行中子屏蔽,重新检查了故障的发生率。为了进一步研究屏蔽选项,并探索与扫描仪故障相关的中子,我们使用蒙特卡罗模拟计算了 CT 扫描仪孔中的中子通量和能谱。模拟包括用 BPE 覆盖 CT 扫描仪本身和覆盖直线加速器头。

结果

我们发现,在 200MU 后,CT 扫描仪的故障率为 57%。虽然在加速器头增加中子屏蔽降低了这种故障风险,但获益甚微,即使在 200MU 后,7.6 厘米厚的 BPE 仍与 29%的故障概率相关。这种屏蔽效果是无论直线加速器头还是 CT 扫描仪是否被屏蔽都能实现的。此外,研究表明,快中子是导致电子故障的主要原因。

结论

正如当前研究中的轨道式 CT 系统所表明的,物理学家应该意识到电子系统可能对中子辐射高度敏感。因此,医学物理学家应该监测那些尚未评估潜在中子敏感性的电子系统。这在电子设备在治疗室中越来越普遍,而新型电子系统可能表现出更高的敏感性的情况下尤其重要。

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