Palo Alto Research Center, Palo Alto, California 94304, United States.
Nano Lett. 2011 Jun 8;11(6):2214-8. doi: 10.1021/nl200114h. Epub 2011 May 17.
Silicon nanowire (SiNW) field-effect transistors (FETs) were fabricated from nanowire mats mechanically transferred from a donor growth wafer. Top- and bottom-gate FET structures were fabricated using a doped a-Si:H thin film as the source/drain (s/d) contact. With a graded doping profile for the a-Si:H s/d contacts, the off-current for the hybrid nanowire/thin-film devices was found to decrease by 3 orders of magnitude. Devices with the graded contacts had on/off ratios of ∼10(5), field-effect mobility of ∼50 cm(2)/(V s), and subthreshold swing of 2.5 V/decade. A 2 in. diagonal 160 × 180 pixel image sensor array was fabricated by integrating the SiNW backplane with an a-Si:H p-i-n photodiode.
硅纳米线 (SiNW) 场效应晶体管 (FET) 是由从施主生长晶片机械转移的纳米线垫制成的。使用掺杂的非晶硅 (a-Si:H) 薄膜作为源/漏 (s/d) 接触来制造顶栅和底栅 FET 结构。对于具有梯度掺杂分布的 a-Si:H s/d 接触,杂交纳米线/薄膜器件的截止电流降低了 3 个数量级。具有梯度接触的器件的导通/关断比约为 10(5),场效应迁移率约为 50 cm(2)/(V s),亚阈值摆幅为 2.5 V/decade。通过将 SiNW 背板与 a-Si:H p-i-n 光电二极管集成,制造了一个 2 英寸对角线的 160 × 180 像素图像传感器阵列。