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利用玉米中的一个可抑制突变体监测Mu转座元件DNA修饰中的体细胞可遗传开关。

Somatically heritable switches in the DNA modification of Mu transposable elements monitored with a suppressible mutant in maize.

作者信息

Martienssen R, Barkan A, Taylor W C, Freeling M

机构信息

Department of Genetics, University of California, Berkeley 94520.

出版信息

Genes Dev. 1990 Mar;4(3):331-43. doi: 10.1101/gad.4.3.331.

Abstract

Many transposable elements in maize alternate between active and inactive phases associated with the modification of their DNA. Elements in an inactive phase lose their ability to transpose, their ability to excise from reporter alleles and, in some cases, their ability to enhance or suppress mutant phenotypes caused by their insertion. The maize mutant hcf106 is a recessive pale green seedling lethal caused by the insertion of the transposable element Mu1. We show that the hcf106 mutant phenotype is suppressed in lines that have lost Mu activity. That is, homozygous hcf106 seedlings are dark green and viable when transposable elements belonging to the Robertson's Mutator family are modified in their terminal inverted repeats, a diagnostic feature of inactive lines. This property of the mutant phenotype has been used to follow clonal leaf sectors containing modified Mu elements that arise from single somatic cells during plant development. The distribution of these sectors indicates that epigenetic switches involving Mu DNA modification occur progressively as the meristem ages.

摘要

玉米中的许多转座元件在活跃和非活跃阶段之间交替,这与它们DNA的修饰有关。处于非活跃阶段的元件失去了转座能力、从报告基因等位基因中切除的能力,在某些情况下,还失去了增强或抑制由其插入引起的突变表型的能力。玉米突变体hcf106是一种隐性淡绿色幼苗致死突变体,由转座元件Mu1的插入引起。我们发现,在Mu活性丧失的品系中,hcf106突变体表型受到抑制。也就是说,当属于罗伯逊氏Mutator家族的转座元件在其末端反向重复序列中发生修饰时(这是无活性品系的一个诊断特征),纯合hcf106幼苗呈深绿色且可存活。突变体表型的这一特性已被用于追踪植物发育过程中由单个体细胞产生的含有修饰Mu元件的克隆叶区段。这些区段的分布表明,涉及Mu DNA修饰的表观遗传开关随着分生组织的老化而逐渐发生。

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