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绝缘 Pb(Zr0.2 Ti0.8)O3 薄膜中畴壁的传导。

Conduction at domain walls in insulating Pb(Zr0.2 Ti0.8)O3 thin films.

机构信息

DPMC, University of Geneva, Switzerland.

出版信息

Adv Mater. 2011 Dec 1;23(45):5377-82. doi: 10.1002/adma.201102254. Epub 2011 Sep 28.

Abstract

Domain wall conduction in insulating Pb(Zr(0.2) Ti(0.8))O(3) thin films is demonstrated. The observed electrical conduction currents can be clearly differentiated from displacement currents associated with ferroelectric polarization switching. The domain wall conduction, nonlinear and highly asymmetric due to the specific local probe measurement geometry, shows thermal activation at high temperatures, and high stability over time.

摘要

在绝缘 Pb(Zr(0.2)Ti(0.8))O(3) 薄膜中观察到了畴壁传导。观察到的电传导电流可以与与铁电极化翻转相关的位移电流明显区分开来。由于特定的局部探针测量几何形状,畴壁传导呈现出非线性和高度不对称性,在高温下表现出热激活,并且随着时间的推移具有高稳定性。

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