连续波光束的快速扫描 STED 和双光子荧光激发显微镜。

Fast scanning STED and two-photon fluorescence excitation microscopy with continuous wave beam.

机构信息

Department of Nanophysics, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy.

出版信息

J Microsc. 2012 Mar;245(3):225-8. doi: 10.1111/j.1365-2818.2011.03577.x. Epub 2011 Dec 15.

DOI:10.1111/j.1365-2818.2011.03577.x

Abstract

In this paper we report stimulated emission depletion (STED) and two-photon excitation (2PE) fluorescence microscopy with continuous wave (CW) laser beam using a new generation laser scanning confocal microscope equipped for STED-CW (TCS STED-CW, Leica Microsystems, Mannheim, Germany). We show the possibility to achieve CW-2PE with the very same beam used for STED-CW. This feature extends the performance of the microscope allowing multimodal imaging (CW-2PE, STED-CW, confocal).

摘要

在本文中，我们报告了使用新一代配备 STED-CW（Leica Microsystems，曼海姆，德国）的激光扫描共聚焦显微镜进行连续波（CW）激光束的受激发射损耗（STED）和双光子激发（2PE）荧光显微镜。我们展示了使用非常相同的光束实现 CW-2PE 的可能性。此功能扩展了显微镜的性能，允许进行多模态成像（CW-2PE、STED-CW、共聚焦）。