Department of Physics and Astronomy, McMaster University, Hamilton, Ontario, Canada.
Phys Rev Lett. 2012 Aug 3;109(5):055701. doi: 10.1103/PhysRevLett.109.055701.
We have examined the direct effect of manipulating the number of free surfaces on the measured glass transition temperature T(g) of thin polystyrene films. Thin films in the range 35 nm < h < 114 nm with molecular weights of 592 kg/mol and 1144 kg/mol were studied. Ellipsometry was used to determine the temperature dependence of the thickness and refractive index of freestanding films. By noting the change in slope in each of these quantities, a T(g) value can be assigned in quantitative agreement with previously reported results. For thin freestanding films this value is reduced from that of the bulk. The exact same films are then transferred to a Si substrate and the T(g) of the resulting supported film was determined. The T(g) values of the now supported films are the same as the bulk value and the same as previous reports of similar supported films. These experiments unambiguously show that free interfaces are the dominant cause of the T(g) reductions for the film thicknesses studied.
我们研究了通过改变自由表面数量对所测聚苯乙烯薄膜玻璃化转变温度 T(g) 的直接影响。研究了分子量分别为 592kg/mol 和 1144kg/mol、厚度为 35nm<h<114nm 的薄膜。使用椭圆偏振法来确定自由薄膜的厚度和折射率随温度的变化。通过注意到这些量的斜率变化,可以定量地分配与先前报道的结果一致的 T(g) 值。对于薄的自由薄膜,这个值会低于本体值。然后将完全相同的薄膜转移到 Si 基底上,并确定得到的支撑薄膜的 T(g)。现在支撑薄膜的 T(g) 值与本体值相同,也与之前类似支撑薄膜的报道相同。这些实验明确表明,对于研究的薄膜厚度,自由界面是导致 T(g) 降低的主要原因。