Tanimura H, Kanasaki J, Tanimura K
The Institute of Scientific and Industrial Research, Osaka University, 8-1, Mihogaoka, Ibaraki, Osaka 567-0047, Japan.
Sci Rep. 2014 Oct 30;4:6849. doi: 10.1038/srep06849.
Impact ionization (IMP) is a fundamental process in semiconductors, which results in carrier multiplication through the decay of a hot electron into a low-energy state while generating an electron-hole pair. IMP is essentially a state selective process, which is triggered by electron-electron interaction involving four electronic states specified precisely by energy and momentum conservations. However, important state-selective features remain undetermined due to methodological limitations in identifying the energy and momentum of the states involved, at sufficient temporal resolution, to reveal the fundamental dynamics. Here we report state-resolved ultrafast hot electron dynamics of IMP in InSb, a semiconductor with the lowest band-gap energy. The ultrafast decay of state-resolved hot-electron populations and the corresponding population increase at the conduction band minimum are directly captured, and the rate of IMP is unambiguously determined. Our analysis, based on the direct knowledge of state-resolved hot electrons, provides far deeper insight into the physics of ultrafast electron correlation in semiconductors.
碰撞电离(IMP)是半导体中的一个基本过程,它通过热电子衰变为低能态同时产生一个电子 - 空穴对来实现载流子倍增。IMP本质上是一个状态选择性过程,它由涉及四个由能量和动量守恒精确指定的电子态的电子 - 电子相互作用触发。然而,由于在足够的时间分辨率下识别所涉及状态的能量和动量以揭示基本动力学方面存在方法上的局限性,重要的状态选择性特征仍未确定。在此,我们报告了在具有最低带隙能量的半导体锑化铟中IMP的状态分辨超快热电子动力学。直接捕捉到了状态分辨热电子布居的超快衰减以及导带最小值处相应的布居增加,并明确确定了IMP的速率。我们基于对状态分辨热电子的直接了解所进行的分析,为半导体中超快电子关联的物理机制提供了更深入的见解。