以电子伏特精度测量高能（10 - 60 keV）X射线谱线宽度。

Measurement of high-energy (10-60 keV) x-ray spectral line widths with eV accuracy.

作者信息

Seely J F, Glover J L, Hudson L T, Ralchenko Y, Henins Albert, Pereira N, Feldman U, Di Stefano C A, Kuranz C C, Drake R P, Chen Hui, Williams G J, Park J

机构信息

Artep Inc., 2922 Excelsior Springs Court, Ellicott City, Maryland 21042, USA.

National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.

出版信息

Rev Sci Instrum. 2014 Nov;85(11):11D618. doi: 10.1063/1.4891726.

DOI:10.1063/1.4891726

PMID:25430194

Abstract

A high resolution crystal spectrometer utilizing a crystal in transmission geometry has been developed and experimentally optimized to measure the widths of emission lines in the 10-60 keV energy range with eV accuracy. The spectrometer achieves high spectral resolution by utilizing crystal planes with small lattice spacings (down to 2d = 0.099 nm), a large crystal bending radius and Rowland circle diameter (965 mm), and an image plate detector with high spatial resolution (60 μm in the case of the Fuji TR image plate). High resolution W L-shell and K-shell laboratory test spectra in the 10-60 keV range and Ho K-shell spectra near 47 keV recorded at the LLNL Titan laser facility are presented. The Ho K-shell spectra are the highest resolution hard x-ray spectra recorded from a solid target irradiated by a high-intensity laser.

摘要

已开发出一种利用透射几何结构晶体的高分辨率晶体光谱仪，并通过实验进行了优化，以测量能量范围在10 - 60 keV的发射线宽度，精度可达电子伏特。该光谱仪通过使用晶格间距小（低至2d = 0.099 nm）的晶面、大的晶体弯曲半径和罗兰圆直径（965 mm）以及具有高空间分辨率的成像板探测器（富士TR成像板情况下为60 μm）来实现高光谱分辨率。给出了在10 - 60 keV范围内的高分辨率钨L壳层和K壳层实验室测试光谱，以及在LLNL泰坦激光装置记录的47 keV附近的钬K壳层光谱。钬K壳层光谱是从高强度激光辐照的固体靶记录到的最高分辨率硬X射线光谱。