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光栅干涉仪定量暗场对比成像的通用解。

General solution for quantitative dark-field contrast imaging with grating interferometers.

机构信息

1] European Spallation Source ESS AB, Instrument division, Tunavaegan 24, 22100 Lund, Sweden [2] University of Copenhagen, Niels Bohr Institute, Universitetsparken 5, 2100 Copenhagen, Denmark.

出版信息

Sci Rep. 2014 Nov 28;4:7243. doi: 10.1038/srep07243.

Abstract

Grating interferometer based imaging with X-rays and neutrons has proven to hold huge potential for applications in key research fields conveying biology and medicine as well as engineering and magnetism, respectively. The thereby amenable dark-field imaging modality implied the promise to access structural information beyond reach of direct spatial resolution. However, only here a yet missing approach is reported that finally allows exploiting this outstanding potential for non-destructive materials characterizations. It enables to obtain quantitative structural small angle scattering information combined with up to 3-dimensional spatial image resolution even at lab based x-ray or at neutron sources. The implied two orders of magnitude efficiency gain as compared to currently available techniques in this regime paves the way for unprecedented structural investigations of complex sample systems of interest for material science in a vast range of fields.

摘要

基于光栅的 X 射线和中子成像技术已经证明在生物学和医学、工程学和磁学等关键研究领域具有巨大的应用潜力。由此产生的暗场成像模式有望获得超出直接空间分辨率的结构信息。然而,这里报告了一种尚未解决的方法,该方法最终可以挖掘这种卓越的潜力,实现无损材料特性分析。它可以获得定量的结构小角散射信息,结合高达 3 维的空间图像分辨率,即使在基于实验室的 X 射线或中子源也是如此。与该领域当前可用技术相比,这种方法的效率提高了两个数量级,为材料科学中广泛领域中复杂样品系统的前所未有的结构研究铺平了道路。

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