Otto Lauren M, Mohr Daniel A, Johnson Timothy W, Oh Sang-Hyun, Lindquist Nathan C
Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN 55455, USA.
Nanoscale. 2015 Mar 7;7(9):4226-33. doi: 10.1039/c4nr06586g.
We present quantitative, spectroscopic polarization interferometry phase measurements on plasmonic surfaces for sensing applications. By adding a liquid crystal variable wave plate in our beam path, we are able to measure phase shifts due to small refractive index changes on the sensor surface. By scanning in a quick sequence, our technique is extended to demonstrate real-time measurements. While this optical technique is applicable to different sensor geometries-e.g., nanoparticles, nanogratings, or nanoapertures-the plasmonic sensors we use here consist of an ultrasmooth gold layer with buried linear gratings. Using these devices and our phase measurement technique, we calculate a figure of merit that shows improvement over measuring only surface plasmon resonance shifts from a reflected intensity spectrum. To demonstrate the general-purpose versatility of our phase-resolved measurements, we also show numerical simulations with another common device architecture: periodic plasmonic slits. Since our technique inherently measures both the intensity and phase of the reflected or transmitted light simultaneously, quantitative sensor device characterization is possible.
我们展示了用于传感应用的等离子体表面的定量、光谱偏振干涉相位测量。通过在光路中添加液晶可变波片,我们能够测量由于传感器表面微小折射率变化而引起的相移。通过快速扫描序列,我们的技术得以扩展以实现实时测量。虽然这种光学技术适用于不同的传感器几何形状,例如纳米颗粒、纳米光栅或纳米孔径,但我们这里使用的等离子体传感器由具有埋入线性光栅的超光滑金层组成。使用这些器件和我们的相位测量技术,我们计算了一个品质因数,该品质因数显示出相对于仅从反射强度光谱测量表面等离子体共振位移的改进。为了证明我们的相分辨测量的通用多功能性,我们还展示了另一种常见器件架构的数值模拟:周期性等离子体狭缝。由于我们的技术本质上同时测量反射或透射光的强度和相位,因此可以对传感器器件进行定量表征。