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快速重离子诱导的自仿射纳米结构BaF₂薄膜表面的分形和多重分形特征

Fractal and multifractal characteristics of swift heavy ion induced self-affine nanostructured BaF2 thin film surfaces.

作者信息

Yadav R P, Kumar Manvendra, Mittal A K, Pandey A C

机构信息

Department of Physics, University of Allahabad, Allahabad 211002, India.

Nanotechnology Application Centre, University of Allahabad, Allahabad 211002, India.

出版信息

Chaos. 2015 Aug;25(8):083115. doi: 10.1063/1.4928695.

Abstract

Fractal and multifractal characteristics of self-affine surfaces of BaF2 thin films, deposited on crystalline Si ⟨1 1 1⟩ substrate at room temperature, were studied. Self-affine surfaces were prepared by irradiation of 120 MeV Ag(9+) ions which modified the surface morphology at nanometer scale. The surface morphology of virgin thin film and those irradiated with different ion fluences are characterized by atomic force microscopy technique. The surface roughness (interface width) shows monotonic decrease with ion fluences, while the other parameters, such as lateral correlation length, roughness exponent, and fractal dimension, did not show either monotonic decrease or increase in nature. The self-affine nature of the films is further confirmed by autocorrelation function. The power spectral density of thin films surfaces exhibits inverse power law variation with spatial frequency, suggesting the existence of fractal component in surface morphology. The multifractal detrended fluctuation analysis based on the partition function approach is also performed on virgin and irradiated thin films. It is found that the partition function exhibits the power law behavior with the segment size. Moreover, it is also seen that the scaling exponents vary nonlinearly with the moment, thereby exhibiting the multifractal nature.

摘要

研究了室温下沉积在晶体硅⟨1 1 1⟩衬底上的BaF₂薄膜自仿射表面的分形和多重分形特性。通过120 MeV的Ag(9+)离子辐照制备自仿射表面,该辐照在纳米尺度上改变了表面形态。用原子力显微镜技术表征原始薄膜和不同离子注量辐照后的薄膜的表面形态。表面粗糙度(界面宽度)随离子注量单调下降,而其他参数,如横向相关长度、粗糙度指数和分形维数,在本质上既没有单调下降也没有单调增加。薄膜的自仿射性质通过自相关函数进一步得到证实。薄膜表面的功率谱密度随空间频率呈现逆幂律变化,表明表面形态中存在分形成分。还对原始薄膜和辐照薄膜进行了基于配分函数方法的多重分形去趋势波动分析。发现配分函数随片段大小呈现幂律行为。此外,还可以看到标度指数随矩非线性变化,从而表现出多重分形性质。

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