Boschker Jos E, Galves Lauren A, Flissikowski Timur, Lopes Joao Marcelo J, Riechert Henning, Calarco Raffaella
Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, 10117 Berlin, Germany.
Sci Rep. 2015 Dec 14;5:18079. doi: 10.1038/srep18079.
Van der Waals (vdW) epitaxy is an attractive method for the fabrication of vdW heterostructures. Here Sb2Te3 films grown on three different kind of graphene substrates (monolayer epitaxial graphene, quasi freestanding bilayer graphene and the SiC (6√3 × 6√3)R30° buffer layer) are used to study the vdW epitaxy between two 2-dimensionally (2D) bonded materials. It is shown that the Sb2Te3 /graphene interface is stable and that coincidence lattices are formed between the epilayers and substrate that depend on the size of the surface unit cell. This demonstrates that there is a significant, although relatively weak, interfacial interaction between the two materials. Lattice matching is thus relevant for vdW epitaxy with two 2D bonded materials and a fundamental design parameter for vdW heterostructures.
范德华(vdW)外延是一种用于制造范德华异质结构的有吸引力的方法。在此,生长在三种不同类型石墨烯衬底(单层外延石墨烯、准独立双层石墨烯和SiC(6√3×6√3)R30°缓冲层)上的Sb2Te3薄膜被用于研究两种二维(2D)键合材料之间的范德华外延。结果表明,Sb2Te3/石墨烯界面是稳定的,并且在外延层和衬底之间形成了取决于表面晶胞尺寸的重合晶格。这表明这两种材料之间存在显著的,尽管相对较弱的界面相互作用。因此,晶格匹配对于两种二维键合材料的范德华外延是相关的,并且是范德华异质结构的一个基本设计参数。