使用两步气相反应工艺沉积在(100)硅片上的甲基碘化铅三甲铵钙钛矿的色散关系数据。
Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process.
作者信息
Phillips Laurie J, Rashed Atef M, Treharne Robert E, Kay James, Yates Peter, Mitrovic Ivona Z, Weerakkody Ayendra, Hall Steve, Durose Ken
机构信息
Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, UK.
Department of Electrical Engineering and Electronics, University of Liverpool, Brownlow Hill, Liverpool L69 3GJ, UK.
出版信息
Data Brief. 2015 Nov 6;5:926-8. doi: 10.1016/j.dib.2015.10.026. eCollection 2015 Dec.
Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.
椭偏仪用于测量光在与沉积在(100)硅片上的有机-无机杂化钙钛矿CH3NH3PbI3（MAPI）薄膜相互作用时发生相移的振幅比和相位差。根据对300至1500纳米波长范围内的椭偏仪数据进行拟合的多振子模型，提取折射率和消光系数。
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