Cant David J H, Wang Yung-Chen, Castner David G, Shard Alexander G
National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, United Kingdom.
Departments of Bioengineering & Chemical Engineering, National ESCA & Surface Analysis Center for Biomedical Problems, University of Washington, Seattle WA.
Surf Interface Anal. 2016 May;48(5):274-282. doi: 10.1002/sia.5923. Epub 2016 Feb 9.
This paper extends a straightforward technique for the calculation of shell thicknesses in core-shell nanoparticles to the case of core-shell-shell nanoparticles using X-ray Photoelectron Spectroscopy (XPS) data. This method can be applied by XPS analysts and does not require any numerical simulation or advanced knowledge, although iteration is required in the case where both shell thicknesses are unknown. The standard deviation in the calculated thicknesses simulated values is typically less than 10%, which is the uncertainty of the electron attenuation lengths used in XPS analysis.
本文将一种用于计算核壳纳米颗粒壳层厚度的直接技术扩展到核壳壳纳米颗粒的情况,使用X射线光电子能谱(XPS)数据。该方法可供XPS分析人员使用,不需要任何数值模拟或高深知识,不过在两个壳层厚度均未知的情况下需要进行迭代。计算厚度模拟值的标准偏差通常小于10%,这是XPS分析中使用的电子衰减长度的不确定度。