Center for Integrated Nanostructure Physics, Institute for Basic Science (IBS) , Suwon 16419, Korea.
Samsung Advanced Institute of Technology , Suwon, 16678, Korea.
Nano Lett. 2017 Jan 11;17(1):453-459. doi: 10.1021/acs.nanolett.6b04449. Epub 2016 Dec 20.
Semiconducting transition metal dichalcogenides (TMDs) are promising materials for photodetection over a wide range of visible wavelengths. Photodetection is generally realized via a phototransistor, photoconductor, p-n junction photovoltaic device, and thermoelectric device. The photodetectivity, which is a primary parameter in photodetector design, is often limited by either low photoresponsivity or a high dark current in TMDs materials. Here, we demonstrated a highly sensitive photodetector with a MoS/h-BN/graphene heterostructure, by inserting a h-BN insulating layer between graphene electrode and MoS photoabsorber, the dark-carriers were highly suppressed by the large electron barrier (2.7 eV) at the graphene/h-BN junction while the photocarriers were effectively tunneled through small hole barrier (1.2 eV) at the MoS/h-BN junction. With both high photocurrent/dark current ratio (>10) and high photoresponsivity (180 AW), ultrahigh photodetectivity of 2.6 × 10 Jones was obtained at 7 nm thick h-BN, about 100-1000 times higher than that of previously reported MoS-based devices.
半导体过渡金属二卤族化合物 (TMDs) 是一种在宽可见波长范围内进行光电探测的有前途的材料。光电探测通常通过光电晶体管、光电导、p-n 结光伏器件和热电器件来实现。光电探测器的主要参数是光电探测率,其通常受到 TMDs 材料中低光响应率或高暗电流的限制。在这里,我们通过在石墨烯电极和 MoS 光吸收器之间插入 h-BN 绝缘层,展示了具有 MoS/h-BN/石墨烯异质结构的高灵敏度光电探测器,在石墨烯/h-BN 结处的大电子势垒(2.7eV)高度抑制了暗载流子,而光载流子则通过 MoS/h-BN 结处的小孔势垒(1.2eV)有效隧穿。在 7nm 厚的 h-BN 中,获得了超高的光电探测率 2.6×10^11 Jones,约为之前报道的基于 MoS 的器件的 100-1000 倍,具有高光电流/暗电流比(>10)和高光响应率(180AW)。