Department of Materials Science & Engineering and Institute of Materials Science, University of Connecticut, 97 North Eagleville Rd., Unit 3136, Storrs, CT, 06269-3136, USA.
Sci Rep. 2017 Jul 21;7(1):6128. doi: 10.1038/s41598-017-06357-y.
The electronic structure of an insulator encodes essential signatures of its short-term electrical performance and long-term reliability. A critical long-standing challenge though is that key features of the electronic structure of an insulator (and its evolution) under realistic conditions have not been entirely accessible, either via experimental or computational approaches, due to the inherent complexities involved. In this comprehensive study, we reveal the role of chemical and morphological imperfections that inevitably exist within the technologically important prototypical and pervasive insulator, polyethylene (PE), and at electrode/PE interfaces. Large-scale density functional theory computations and long-time molecular dynamics simulations were employed to accurately recover, explain and unravel a wide variety of experimental data obtained during the electrical degradation of PE. This scheme has allowed us to directly and realistically address the role of chemical, morphological and interfacial complexity in determining electronic structure. These efforts take us a step closer to understanding and potentially controlling dielectric degradation and breakdown.
绝缘体的电子结构编码了其短期电性能和长期可靠性的基本特征。然而,一个长期存在的关键挑战是,由于涉及到的固有复杂性,无论是通过实验还是计算方法,都无法完全获得绝缘体(及其演变)在实际条件下的电子结构的关键特征。在这项全面的研究中,我们揭示了在技术上重要的原型和普遍的绝缘体聚乙烯(PE)以及在电极/PE 界面内不可避免存在的化学和形态缺陷的作用。我们利用大规模密度泛函理论计算和长时间分子动力学模拟,准确地恢复、解释和揭示了在 PE 电降解过程中获得的各种实验数据。该方案使我们能够直接、真实地处理化学、形态和界面复杂性在确定电子结构中的作用。这些努力使我们更接近于理解和潜在控制介电降解和击穿。