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爱尔康威视EX500光学角膜测厚仪在准分子激光原位角膜磨镶术(LASIK)中的准确性。

Accuracy of Alcon WaveLight EX500 optical pachymetry during LASIK.

作者信息

Mifflin Mark D, Mortensen Xavier M, Betts Brent S, Gross Cole, Zaugg Brian

机构信息

Department of Ophthalmology and Visual Sciences, John A Moran Eye Center, University of Utah, Salt Lake City, UT.

University of Nevada School of Medicine, Reno, NV, USA.

出版信息

Clin Ophthalmol. 2017 Aug 17;11:1513-1517. doi: 10.2147/OPTH.S138459. eCollection 2017.

Abstract

PURPOSE

To study the accuracy and reliability of optical pachymetry using the Alcon WaveLight EX500 during laser-assisted in situ keratomileusis (LASIK).

MATERIALS AND METHODS

This was a retrospective chart review of 90 eyes from 45 patients who had undergone LASIK (mean age 35.2±8.2 years; 19 males, 26 females). The WaveLight FS200 femtosecond laser was programmed to cut LASIK flaps at a desired depth of 120 μm. Optical low-coherence reflectometry (WaveLight EX500) was used to measure central corneal thickness prior to lifting the flap, and the residual stromal bed immediately after excimer ablation. Flap thickness (FT) was calculated using simple subtraction. Optical coherence tomography (OCT) was used to measure central corneal thickness, flap thickness, and residual stromal bed in the postoperative period and the results compared to intraoperative measurements.

RESULTS

Mean programmed FS200 FT was 119 μm. Mean FT using EX500 optical pachymetry was 109 μm. The difference between FS200- programmed and EX500-measured FT was 9 μm (<0.001). There was also a significant difference between the EX500 and OCT FT (109 μm vs 119 μm, respectively; <0.001).

CONCLUSION

FT values calculated using intraoperative EX500 optical pachymetry were significantly lower than programmed FS200 values or OCT measurements.

摘要

目的

研究在准分子激光原位角膜磨镶术(LASIK)过程中使用爱尔康WaveLight EX500进行光学测厚的准确性和可靠性。

材料与方法

这是一项对45例患者的90只眼睛进行的回顾性图表分析,这些患者均接受了LASIK手术(平均年龄35.2±8.2岁;男性19例,女性26例)。将WaveLight FS200飞秒激光设定为在所需深度120μm处制作LASIK角膜瓣。在掀起角膜瓣之前,使用光学低相干反射测量法(WaveLight EX500)测量中央角膜厚度,并在准分子激光消融后立即测量剩余基质床厚度。通过简单减法计算角膜瓣厚度(FT)。在术后使用光学相干断层扫描(OCT)测量中央角膜厚度、角膜瓣厚度和剩余基质床厚度,并将结果与术中测量结果进行比较。

结果

FS200设定的平均角膜瓣厚度为119μm。使用EX500光学测厚法测得的平均角膜瓣厚度为109μm。FS200设定值与EX500测量值之间的角膜瓣厚度差异为9μm(<0.001)。EX500测量的角膜瓣厚度与OCT测量值之间也存在显著差异(分别为109μm和119μm;<0.001)。

结论

术中使用EX500光学测厚法计算得到的角膜瓣厚度值显著低于FS200设定值或OCT测量值。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ea07/5566874/aa7ea44fec12/opth-11-1513Fig1.jpg

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