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锐钛矿 TiO(110)-氮化钛 (TiN) 界面原子级结构的从头算研究。

Ab Initio Study of the Atomic Level Structure of the Rutile TiO(110)-Titanium Nitride (TiN) Interface.

机构信息

Tyndall National Institute, University College Cork , Lee Maltings, Dyke Parade, Cork T12 R5CP, Ireland.

出版信息

ACS Appl Mater Interfaces. 2017 Nov 1;9(43):38089-38100. doi: 10.1021/acsami.7b08840. Epub 2017 Oct 17.

Abstract

Titanium nitride (TiN) is widely used in industry as a protective coating due to its hardness and resistance to corrosion and can spontaneously form a thin oxide layer when it is exposed to air, which could modify the properties of the coating. With limited understanding of the TiO-TiN interfacial system at present, this work aims to describe the structural and electronic properties of oxidized TiN based on a density functional theory (DFT) study of the rutile TiO(110)-TiN(100) interface model system, also including Hubbard +U correction on Ti 3d states. The small lattice mismatch gives a good stability to the TiO-TiN interface after depositing the oxide onto TiN through the formation of interfacial Ti-O bonds. Our DFT+U study shows the presence of Ti cations in the TiO region, which are preferentially located next to the interface region as well as the rotation of the rutile TiO octahedra in the interface structure. The DFT+U TiO electronic density of states (EDOS) shows localized Ti defect states forming in the midgap between the top edge of the valence and the bottom of the conduction band. We increase the complexity of our models by the introduction of nonstoichiometric compositions. Although the vacancy formation energies for Ti in TiN (E (Ti) ≥ 4.03 eV) or O in the oxide (E (O) ≥ 3.40 eV) are quite high relative to perfect TiO-TiN, defects are known to form during the oxide growth and can therefore be present after TiO formation. Our results show that a structure with exchanged O and N can lie 0.82 eV higher in energy than the perfect system, suggesting the stability of structures with interdiffused O and N anions at ambient conditions. The presence of N in TiO introduces N 2p states localized between the top edge of the O 2p valence states and the midgap Ti 3d states, thus reducing the band gap in the TiO region for the exchanged O/N interface EDOS. The outcomes of these simulations give us a most comprehensive insight on the atomic level structure and the electronic properties of oxidized TiN surfaces.

摘要

氮化钛(TiN)由于其硬度和耐腐蚀性,被广泛应用于工业作为保护涂层,并且在暴露于空气中时会自发形成一层薄的氧化物层,这可以改变涂层的性质。由于目前对 TiO-TiN 界面系统的了解有限,本工作旨在通过对金红石 TiO(110)-TiN(100)界面模型系统的密度泛函理论(DFT)研究,描述氧化氮化钛的结构和电子特性,其中包括对 Ti 3d 态的 Hubbard +U 修正。小的晶格失配使得在 TiN 上沉积氧化物后,TiO-TiN 界面具有很好的稳定性,通过形成界面 Ti-O 键。我们的 DFT+U 研究表明,在 TiO 区域存在 Ti 阳离子,它们优先位于界面附近以及界面结构中金红石 TiO 八面体的旋转。DFT+U TiO 电子态密度(EDOS)表明,在价带顶和导带底之间的能带隙中形成了局域化的 Ti 缺陷态。我们通过引入非化学计量组成来增加模型的复杂性。尽管 TiN 中 Ti 空位形成能(E (Ti) ≥ 4.03 eV)或氧化物中 O 空位形成能(E (O) ≥ 3.40 eV)相对于完美的 TiO-TiN 相当高,但已知在氧化物生长过程中会形成缺陷,因此在 TiO 形成后可能存在。我们的结果表明,具有交换 O 和 N 的结构可以比完美系统高出 0.82 eV,这表明在环境条件下具有互扩散 O 和 N 阴离子的结构是稳定的。TiO 中 N 的存在引入了位于 O 2p 价态顶和能带隙中 Ti 3d 态之间的 N 2p 态,从而减小了交换 O/N 界面 EDOS 中 TiO 区域的带隙。这些模拟的结果使我们对氧化氮化钛表面的原子级结构和电子特性有了最全面的了解。

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